KS C IEC PAS 62240-2008(2023)
Use of semiconductor devices outside manufacturers specified temperature range
- Standard No.
- KS C IEC PAS 62240-2008(2023)
- Release Date
- 2008
- Published By
- Korean Agency for Technology and Standards (KATS)
- Lastest
- KS C IEC PAS 62240-2008(2023)
- Introduction
The KS C IEC PAS 62240-2008 (2023) standard, developed by the Korea Agency for Technology and Standards (KR-KATS), was published on November 28, 2008. This document provides guidance for the use of semiconductor devices outside the temperature ranges specified by manufacturers. It aims to ensure that users understand and are aware of the potential risks and performance limitations when operating these components in non-standard environmental conditions.
The standard outlines specific criteria and recommendations for assessing the reliability and durability of semiconductors under extreme temperatures, which may include both high-temperature and low-temperature scenarios. It covers a variety of semiconductor types commonly used across multiple industries, including but not limited to microcontrollers, memory chips, and power devices.
By adhering to KS C IEC PAS 62240-2023, manufacturers and users can better prepare for potential issues arising from out-of-range temperature conditions. This helps in mitigating risks associated with equipment failure due to improper use or environmental exposure.
*** Please note: This description may not be accurate, please refer to the official documentation.
KS C IEC PAS 62240-2008(2023) history
- 2023 KS C IEC PAS 62240-2023 Use of semiconductor devices outside manufacturers specified temperature range
- 0000 KS C IEC PAS 62240-2008(2018)