YD/T 3037.2-2023 Test method for characteristics of mass storage interface between Universal Integrated Circuit Card (UICC) and terminals Part 2: UICC (English Version)
This document applies to the development and production of UICC cards that support large-capacity storage interfaces.
YD/T 3037.2-2023 history
2023YD/T 3037.2-2023 Test method for characteristics of mass storage interface between Universal Integrated Circuit Card (UICC) and terminals Part 2: UICC