YD/T 3037.2-2023
Test method for characteristics of mass storage interface between Universal Integrated Circuit Card (UICC) and terminals Part 2: UICC (English Version)

Test method for characteristics of mass storage interface between Universal Integrated Circuit Card (UICC) and terminals Part 2: UICC
Standard No.
YD/T 3037.2-2023
Language
Chinese, Available in English version
Release Date
2023
Published By
Professional Standard - Post and Telecommunication
Lastest
YD/T 3037.2-2023
Replace
YD/T 3037.2-2016
Scope
This document applies to the development and production of UICC cards that support large-capacity storage interfaces.

YD/T 3037.2-2023 history

  • 2023 YD/T 3037.2-2023 Test method for characteristics of mass storage interface between Universal Integrated Circuit Card (UICC) and terminals Part 2: UICC



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