YD/T 3037.1-2023 Test method for characteristics of mass storage interface between Universal Integrated Circuit Card (UICC) and terminal - Part 1: Terminal (English Version)
This document applies to the development and production of terminal interfaces that support large-capacity storage interfaces.
YD/T 3037.1-2023 history
2023YD/T 3037.1-2023 Test method for characteristics of mass storage interface between Universal Integrated Circuit Card (UICC) and terminal - Part 1: Terminal