IEC 62047-44:2024
Semiconductor devices - Micro-electromechanical devices - Part 44: Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices
- Standard No.
- IEC 62047-44:2024
- Release Date
- 2024
- Published By
- International Electrotechnical Commission (IEC)
- Lastest
- IEC 62047-44:2024
IEC 62047-44:2024 history
- 2024 IEC 62047-44:2024 Semiconductor devices - Micro-electromechanical devices - Part 44: Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices