DANSK DS/EN 60749-35:2007
Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components
- Standard No.
- DANSK DS/EN 60749-35:2007
- Release Date
- 2007
- Published By
- SCC
- Lastest
- DANSK DS/EN 60749-35:2007
DANSK DS/EN 60749-35:2007 history
- 2007 DANSK DS/EN 60749-35:2007 Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components