PD IEC/TS 62607-12-3:2026
BSI · 2026-06-01
Nanomanufacturing - Key control characteristics - Part 12-3: 2D material-related products - Schottky barrier heights of 2D material-based field-effect transistors: temperature-dependent current-voltage measurements
1Key Takeaways
This part of IEC 62607 establishes a standardized method to determine the key control characteristic – Schottky barrier height (SBH) from the temperature-dependent current–voltage characterization results obtained from two-dimensional (2D) material-based electronic devices. It defines the Schottky barrier, specifies th…
2Scope / Description
This part of IEC 62607 establishes a standardized method to determine the key control characteristic – Schottky barrier height (SBH) from the temperature-dependent current–voltage characterization results obtained from two-dimensional (2D) material-based electronic devices. It defines the Schottky barrier, specifies the sample and measurement procedure, provides mathematical formulas, case studies and references.
3Version History
PD IEC/TS 62607-12-3:2026
2026-06-01
5Citation Network
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6Frequently Asked Questions
What is PD IEC/TS 62607-12-3:2026?
PD IEC/TS 62607-12-3:2026 — Nanomanufacturing - Key control characteristics - Part 12-3: 2D material-related products - Schottky barrier heights of 2D material-based field-effect transistors: temperature-dependent current-voltage measurements is an international standard developed by British Standards Institution (BSI). This part of IEC 62607 establishes a standardized method to determine the key control characteristic – Schottky barrier height (SBH) from the temperature-dependent current–voltage characterization results obtained from two-dimensional (2D)...
What does PD IEC/TS 62607-12-3:2026 cover?
This standard covers: This part of IEC 62607 establishes a standardized method to determine the key control characteristic – Schottky barrier height (SBH) from the temperature-dependent current–voltage characterization results obtained from two-dimensional (2D) material-based electronic devices. It defines the Schottky...
Who should use this standard?
This standard is intended for organizations, professionals, and stakeholders involved in various industries and sectors. It is applicable to manufacturers, service providers, regulatory bodies, and certification organizations.
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The current published version is PD IEC/TS 62607-12-3:2026, published on 2026-06-01. Always check for amendments or pending revisions.
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