IEC 60747-11:1985
IEC · 1985
Semiconductor devices. Discrete devices. Part 11 : Sectional Specification for discrete devices
Replaced
ICS 31.200
1Key Takeaways
Applicable to quality assessment for discrete semiconductor devices. Gives specific requirements for quality conformance inspection (included in QC 750000 of the IECQ system) and identification of terminals; represents the sectional specification. Contai
2Scope / Description
Applicable to quality assessment for discrete semiconductor devices. Gives specific requirements for quality conformance inspection (included in QC 750000 of the IECQ system) and identification of terminals; represents the sectional specification. Contai
3Version History
5Citation Network
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Referenced herein
6Frequently Asked Questions
What is IEC 60747-11:1985?
IEC 60747-11:1985 — Semiconductor devices. Discrete devices. Part 11 : Sectional Specification for discrete devices is an international standard developed by International Electrotechnical Commission (IEC). Applicable to quality assessment for discrete semiconductor devices. Gives specific requirements for quality conformance inspection (included in QC 750000 of the IECQ system) and identification of terminals; represents the sectional specification....
What does IEC 60747-11:1985 cover?
This standard covers: Applicable to quality assessment for discrete semiconductor devices. Gives specific requirements for quality conformance inspection (included in QC 750000 of the IECQ system) and identification of terminals; represents the sectional specification. Contai
Who should use this standard?
This standard is intended for organizations, professionals, and stakeholders involved in various industries and sectors. It is applicable to manufacturers, service providers, regulatory bodies, and certification organizations.
What is the latest version of IEC 60747-11:1985?
The current published version is IEC 60747-11:1985, published on 1985. Always check for amendments or pending revisions.
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