Shunt power capacitors of the self-healing type for a.c. systems having a rated voltage up to and including 660 V. Part 2: Ageing test, self-healing test and destruction test

This technical specification establishes the requirements for aging, self-restoration, and destructive testing procedures applicable to self-restoring shunt capacitors designed for nominal voltages below or equal to 660 volts alternating current. The document provides detailed methodologies to evaluate the long-term reliability and operational safety of these components under stress conditions. It outlines specific test environments and measurement protocols to verify the capacitors ability to recover from short-circuit events without permanent damage. The content covers criteria for determining failure modes and defines the parameters necessary to assess the durability of the dielectric materials and internal structures. By adhering to these guidelines, manufacturers can ensure consistent quality across their production lines while validating performance characteristics under defined limits. The procedures described facilitate the comparison of product behaviors in controlled laboratory settings, supporting the verification of design specifications without referencing the original publishing body or exact date of issuance.