Instruments for the measurement of surface roughness by the profile method; Contact (stylus) instruments of consecutive profile transformation; Contact profile meters, system M

This technical document establishes a unified framework for the calibration and operation of mechanical instruments designed to evaluate surface texture characteristics. Specifically, it addresses the specifications for continuous contour tracing devices that utilize a contact stylus to capture profile data. The provisions within this standard define the geometric dimensions, mechanical tolerances, and operational procedures required to ensure consistent measurement results across different environments. It outlines the criteria for the "M" system contact points, which serve as the fundamental interface between the instrument and the workpiece. By standardizing the interaction between the stylus and the surface, the document facilitates accurate assessment of roughness parameters. Adherence to these guidelines allows manufacturers and laboratories to maintain comparability in their data, supporting quality control processes and engineering specifications. The content focuses on the physical attributes of the apparatus and the methodological approach for converting physical surface variations into measurable electronic or mechanical signals.