BS EN 60749-34:2010
BSI · 2011-02-28

Semiconductor devices. Mechanical and climatic test methods. Power cycling

ICS 31.080.01

3Version History

BS EN 60749-34:2004 older 2004-06-22
BS EN 60749-34:2010 2011-02-28

4Standard Metadata

Standard Number
BS EN 60749-34:2010
Status
Current (70% confidence)
Publisher
British Standards Institution (BSI)
Publication Date
2011-02-28
Implementation
2011-02-28
ICS Classification
31.080.01 (Semiconductor devices in general) 

5Citation Network

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Cite this standard
5
Referenced herein
Referenced by BS EN 60749-34:2010
IEC 60747-1:2006 IEC 60747-2:2000 IEC 60747-6:2000 IEC 60749-23 IEC 60749-3

6Frequently Asked Questions

What is BS EN 60749-34:2010?
BS EN 60749-34:2010 — Semiconductor devices. Mechanical and climatic test methods. Power cycling is an international standard developed by British Standards Institution (BSI).
What does BS EN 60749-34:2010 cover?
This standard covers:
Who should use this standard?
This standard is intended for organizations, professionals, and stakeholders involved in various industries and sectors. It is applicable to manufacturers, service providers, regulatory bodies, and certification organizations.
What is the latest version of BS EN 60749-34:2010?
The current published version is BS EN 60749-34:2010, published on 2011-02-28. Always check for amendments or pending revisions.
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