DIN EN 60749-34:2011
DIN · 2011-05

Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling (IEC 60749-34:2010); German version EN 60749-34:2010

Replaced ICS 31.080.01

3Version History

DIN EN 60749-34:2004 older 2004-10-01
DIN EN 60749-34:2004-10 older 2004-10-01
DIN EN 60749-34 E:2009 Amd E/2009-01 older 2009-10-01
DIN EN 60749-34 E:2009-10 Amd E/2009-10 older 2009-10-01
DIN EN 60749-34:2011 2011-05
DIN EN 60749-34:2011-05 newer 2011-05

4Standard Metadata

Standard Number
DIN EN 60749-34:2011
Status
Replaced
Publisher
German Institute for Standardization
Publication Date
2011-05
Implementation
2011-05-01
ICS Classification
31.080.01 (Semiconductor devices in general) 

5Citation Network

0
Cite this standard
5
Referenced herein
Referenced by DIN EN 60749-34:2011
IEC 60747-1:2006 IEC 60747-2:2000 IEC 60747-6:2000 IEC 60749-23 IEC 60749-3

6Frequently Asked Questions

What is DIN EN 60749-34:2011?
DIN EN 60749-34:2011 — Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling (IEC 60749-34:2010); German version EN 60749-34:2010 is an international standard developed by German Institute for Standardization.
What does DIN EN 60749-34:2011 cover?
This standard covers:
Who should use this standard?
This standard is intended for organizations, professionals, and stakeholders involved in various industries and sectors. It is applicable to manufacturers, service providers, regulatory bodies, and certification organizations.
What is the latest version of DIN EN 60749-34:2011?
The current published version is DIN EN 60749-34:2011, published on 2011-05. Always check for amendments or pending revisions.
How do I purchase DIN EN 60749-34:2011?
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