Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 2 : General principles of measuring methods

This document outlines general principles governing the measurement of semiconductor devices, specifically addressing the fundamental rating values and characteristics associated with them. It establishes a standardized framework for determining how key electrical and physical parameters are tested and reported across various types of semiconductor components. The content focuses on defining measurement methodologies to ensure consistency, reproducibility, and comparability of data obtained in different laboratory environments. It covers essential aspects such as test conditions, equipment calibration requirements, and procedural guidelines necessary for accurate assessment. By providing a unified approach to measurement, this specification helps facilitate international trade and technical communication regarding semiconductor performance. The text details the logical sequence of operations required to validate device specifications without deviation from the established norms. It serves as a foundational reference for engineers and technicians involved in quality assurance and product development within the semiconductor industry, ensuring that all measurements adhere to a common set of rules and definitions.