1Key Takeaways
This document specifies methods for evaluating bias temperature instability (BTI, including PBTI and NBTI) of silicon carbide (SiC) metal-oxide-semiconductor devices used in power electronic conversion. It covers physical mechanisms of V_T shift and hysteresis, measurement techniques for threshold voltage and hysteresi…
2Scope / Description
This document specifies methods for evaluating bias temperature instability (BTI, including PBTI and NBTI) of silicon carbide (SiC) metal-oxide-semiconductor devices used in power electronic conversion. It covers physical mechanisms of V_T shift and hysteresis, measurement techniques for threshold voltage and hysteresis, various stress and measure strategies (such as MSM, FDC, gate-sweep), lifetime prediction models, and failure criteria.
6Frequently Asked Questions
What is IEC 63601:2026?
IEC 63601:2026 — Guideline for evaluating bias temperature instability of silicon carbide metal-oxide-semiconductor devices for power electronic conversion is an international standard developed by International Electrotechnical Commission (IEC). This document specifies methods for evaluating bias temperature instability (BTI, including PBTI and NBTI) of silicon carbide (SiC) metal-oxide-semiconductor devices used in power electronic conversion. It covers physical mechanisms of V_T shift and...
What does IEC 63601:2026 cover?
This standard covers: This document specifies methods for evaluating bias temperature instability (BTI, including PBTI and NBTI) of silicon carbide (SiC) metal-oxide-semiconductor devices used in power electronic conversion. It covers physical mechanisms of V_T shift and hysteresis, measurement techniques for threshold...
Who should use this standard?
This standard is intended for organizations, professionals, and stakeholders involved in various industries and sectors. It is applicable to manufacturers, service providers, regulatory bodies, and certification organizations.
What is the latest version of IEC 63601:2026?
The current published version is IEC 63601:2026, published on 2026-02-01. Always check for amendments or pending revisions.
How do I purchase IEC 63601:2026?
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