Printed electronics - Part 203: Materials - Semiconductor ink

5.3 Physical property tests

Density test can adopt various methods such as ISO 758, ISO 1183-1, ISO 2811, etc.

Innovations in electrical performance testing

6.3.1 Charge mobility measurement

Important updates to the 2024 version of the standard: Added 6.3.1.2.2 Normalized on-state current measurement method to improve the accuracy of TFT device performance evaluation:

• Using field-effect transistor structure to test charge mobility
• Normalization processing eliminates the influence of device size differences
• Provides a standardized data processing process

6.3.2 Dielectric Properties Test

The dielectric constant calculation formula has been revised to ensure international comparability of the measurement results:

ε_r = C·d / (ε₀·A)

Where C is the capacitance, d is the film thickness, A is the electrode area, and ε₀ is the vacuum dielectric constant

Optical Properties Test System

6.4.2 Light Transmittance Test

According to ISO 13468-1:2019 and ISO 13468-2:1999, single-beam or dual-beam instrument is used for measurement:

• Wavelength range: 380-780nm
• Measurement accuracy: ±0.5%
• Sample requirements: Surface flatness ≤0.1mm

6.4.4

Appendix B provides a detailed test point distribution scheme to ensure the representativeness of the evaluation results:

Storage and aging test specifications

7.2 Storage condition requirements

The standard specifies the recommended storage conditions for semiconductor inks:

• Temperature: 15-25°C
• Relative humidity: 30-60%
• Store away from light and avoid direct sunlight
• Keep sealed container to prevent solvent volatilization

7.3 Aging degradation assessment

Appendix A provides a detailed ink aging assessment method:

• Accelerated aging conditions: 40°C/75%RH
• Evaluation cycles: 0, 7, 14, 28 days
• Performance indicators: Viscosity change rate ≤ 15%
• Electrical performance: Mobility decrease rate ≤ 20%

Standard implementation recommendations

Laboratory configuration requirements

To meet the standard testing requirements, the laboratory should be equipped with the following equipment:

• High-precision balance: accuracy 0.0001g, used for solid content testing
• Rheometer: shear rate range 0.1-1000s⁻¹
• Surface tensiometer: Wilhelmy plate method or Du Noüy ring method
• Semiconductor parameter analyzer: used for TFT characteristic testing

Quality control system

Establish a semiconductor ink quality control system based on this standard:

1. Raw material incoming inspection: Conduct physical property tests in accordance with the requirements of Chapter 5
2. Production process monitoring: Real-time monitoring of key parameters such as viscosity and surface tension
3. Finished product performance verification: Conduct electrical and optical performance tests in accordance with the requirements of Chapter 6
4. Storage stability assessment: Conduct aging tests regularly to ensure stable performance within the product’s shelf life

Technology Development Trends

With the rapid development of printed electronics technology, semiconductor ink standards will face the following challenges and development directions:

• Demand for test methods for higher mobility materials
• Test requirements for bending stability in flexible display applications
• New characterization techniques for nanomaterial inks
• Evaluation standards for environmentally friendly solvent systems

IEC 62899-203:2024 provides comprehensive technical specifications and test methods for semiconductor inks used in printed electronics, which is of great significance to promoting industry standardization, improving product quality, and facilitating technological innovation. It is recommended that relevant companies actively adopt this standard, establish a complete quality control system, and enhance product competitiveness.