IEC 60747-6:1983
IEC · 1983

Semiconductor devices. Discrete devices. Part 6 : Thyristors

Replaced ICS 31.080.20 Cited by 1

1Key Takeaways

This document establishes comprehensive technical requirements and test methods for thyristors, a critical category within semiconductor discrete components. It defines the classification system, electrical parameters, and physical dimensions necessary to ensure component reliability and interchangeability across dive…

2Scope / Description

This document establishes comprehensive technical requirements and test methods for thyristors, a critical category within semiconductor discrete components. It defines the classification system, electrical parameters, and physical dimensions necessary to ensure component reliability and interchangeability across diverse applications. The content specifies performance criteria for both rectifiers and controlled rectifiers, covering aspects such as voltage ratings, current handling capabilities, switching characteristics, and thermal limits. Detailed testing procedures are provided to validate that devices meet the specified operational standards under various conditions. The guidelines aim to harmonize manufacturing processes and quality assurance protocols, facilitating international trade and system integration. By standardizing measurement techniques and defining boundary conditions for safe operation, the text supports engineers in selecting appropriate components for power control systems, industrial automation, and energy distribution networks. The framework serves as a reference for design specifications and compliance verification, ensuring consistent performance and safety in electronic circuits utilizing thyristor technology.

3Version History

IEC 60747-6:1983/AMD1:1991 Amd 1/1991 newer 1991
IEC 60747-6:1983/AMD2:1994 Amd 2/1994 newer 1994
IEC 60747-6:2000 newer 2000-12
IEC 60747-6:2016 newer 2016-04-01
IEC 60747-6:2025 PRV newer 2025-06-01

5Citation Network

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6Frequently Asked Questions

What is IEC 60747-6:1983?
IEC 60747-6:1983 — Semiconductor devices. Discrete devices. Part 6 : Thyristors is an international standard developed by International Electrotechnical Commission (IEC). This document establishes comprehensive technical requirements and test methods for thyristors, a critical category within semiconductor discrete components. It defines the classification system, electrical parameters, and physical dimensions...
What does IEC 60747-6:1983 cover?
This standard covers: This document establishes comprehensive technical requirements and test methods for thyristors, a critical category within semiconductor discrete components. It defines the classification system, electrical parameters, and physical dimensions necessary to ensure component reliability and...
Who should use this standard?
This standard is intended for organizations, professionals, and stakeholders involved in various industries and sectors. It is applicable to manufacturers, service providers, regulatory bodies, and certification organizations.
What is the latest version of IEC 60747-6:1983?
The current published version is IEC 60747-6:1983, published on 1983. Always check for amendments or pending revisions.
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