IEC 60747-6:2016
IEC · 2016-04-01

Semiconductor devices - Part 6: Thyristors

Replaced ICS 31.080.20 Cited by 6

1Key Takeaways

This part of IEC 60747 provides standards for the following types of discrete semiconductor devices: ?C reverse-blocking triode thyristors; ?C reverse-conducting (triode) thyristors; ?C bidirectional triode thyristors (triacs); ?C turn-off thyristors. If no ambiguity is likely to occur@ any of the above may be referred…

2Scope / Description

This part of IEC 60747 provides standards for the following types of discrete semiconductor devices: ?C reverse-blocking triode thyristors; ?C reverse-conducting (triode) thyristors; ?C bidirectional triode thyristors (triacs); ?C turn-off thyristors. If no ambiguity is likely to occur@ any of the above may be referred to as thyristors.

3Version History

IEC 60747-6:1983 older 1983
IEC 60747-6:1983/AMD1:1991 Amd 1/1991 older 1991
IEC 60747-6:1983/AMD2:1994 Amd 2/1994 older 1994
IEC 60747-6:2000 older 2000-12
IEC 60747-6:2016 2016-04-01
IEC 60747-6:2025 PRV newer 2025-06-01

4Standard Metadata

Standard Number
IEC 60747-6:2016
Status
Replaced
Publisher
International Electrotechnical Commission (IEC)
Publication Date
2016-04-01
Implementation
2016-04-15
ICS Classification
31.080.20 (Thyristors) 

5Citation Network

6
Cite this standard
5
Referenced herein
Standards that cite IEC 60747-6:2016
Determination of power losses in high-voltage direct current (HVDC) converter stations with line commutated converters Semiconductor devices - Discrete devices. Isolated power semiconductor devices Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module Semiconductor devices. Mechanical and climatic test methods - Power cycling test for power semiconductor module
Referenced by IEC 60747-6:2016
IEC 60747-1:2006 IEC 60747-1:2006/AMD1:2010 IEC 60749-23 IEC 60749-25 IEC 60749-34:2010

6Frequently Asked Questions

What is IEC 60747-6:2016?
IEC 60747-6:2016 — Semiconductor devices - Part 6: Thyristors is an international standard developed by International Electrotechnical Commission (IEC). This part of IEC 60747 provides standards for the following types of discrete semiconductor devices: ?C reverse-blocking triode thyristors; ?C reverse-conducting (triode) thyristors; ?C bidirectional triode thyristors (triacs); ?C turn-off...
What does IEC 60747-6:2016 cover?
This standard covers: This part of IEC 60747 provides standards for the following types of discrete semiconductor devices: ?C reverse-blocking triode thyristors; ?C reverse-conducting (triode) thyristors; ?C bidirectional triode thyristors (triacs); ?C turn-off thyristors. If no ambiguity is likely to occur@ any of the...
Who should use this standard?
This standard is intended for organizations, professionals, and stakeholders involved in various industries and sectors. It is applicable to manufacturers, service providers, regulatory bodies, and certification organizations.
What is the latest version of IEC 60747-6:2016?
The current published version is IEC 60747-6:2016, published on 2016-04-01. Always check for amendments or pending revisions.
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