IEC 60679-1:2007
IEC · 2007-04

Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification

Replaced ICS 31.140 Cited by 6

1Key Takeaways

This part of IEC 60679 specifies the methods of test and general requirements for quartz crystal controlled oscillators of assessed quality using either capability approval or qualification approval procedures.

2Scope / Description

This part of IEC 60679 specifies the methods of test and general requirements for quartz
crystal controlled oscillators of assessed quality using either capability approval or
qualification approval procedures.

3Version History

IEC 60679-1:1980 older 1980
IEC 60679-1:1980/AMD1:1985 Amd 1/1985 older 1985
IEC 60679-1:1997 older 1997-12
IEC 60679-1:1997/AMD1:2002 Amd 1/2002 older 2002
IEC 60679-1:1997/AMD2:2003 Amd 2/2003 older 2003
IEC 60679-1:2007 2007-04
IEC 60679-1:2017 newer 2017-07-00

4Standard Metadata

Standard Number
IEC 60679-1:2007
Status
Replaced
Publisher
International Electrotechnical Commission (IEC)
Publication Date
2007-04
Implementation
2017-07-29
ICS Classification
31.140 (Piezoelectric and dielectric devices) 
Adopted Standard
DIN EN 60679-1-2008,IDT;BS EN 60679-1-2007,IDT;EN 60679-1-2007,IDT;OEVE/OENORM EN 60679-1-2008,IDT;PN-EN 60679-1-2007,IDT

5Citation Network

6
Cite this standard
0
Referenced herein
Standards that cite IEC 60679-1:2007
Quartz crystal controlled oscillators of assessed quality—Part 4: Sectional specification—Capability approval Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures (IEC 61837-3:2015); German version EN 61837-3:2015 / Note: DIN EN 61837-3 (2001-09) remains valid alo... Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections (IEC 60679-3:2012); German version EN 60679-3:2013 / Note: DIN EN 60679-3 (2002-07) remains valid alongside this standard until 2016-01-18. Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide

6Frequently Asked Questions

What is IEC 60679-1:2007?
IEC 60679-1:2007 — Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification is an international standard developed by International Electrotechnical Commission (IEC). This part of IEC 60679 specifies the methods of test and general requirements for quartz crystal controlled oscillators of assessed quality using either capability approval or qualification approval procedures.
What does IEC 60679-1:2007 cover?
This standard covers: This part of IEC 60679 specifies the methods of test and general requirements for quartz crystal controlled oscillators of assessed quality using either capability approval or qualification approval procedures.
Who should use this standard?
This standard is intended for organizations, professionals, and stakeholders involved in various industries and sectors. It is applicable to manufacturers, service providers, regulatory bodies, and certification organizations.
What is the latest version of IEC 60679-1:2007?
The current published version is IEC 60679-1:2007, published on 2007-04. Always check for amendments or pending revisions.
How do I purchase IEC 60679-1:2007?
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