IEC 60679-1:1997
IEC · 1997-12

Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification

Replaced ICS 01.040.31 ICS 31.140 Cited by 8

1Key Takeaways

This part of IEC 60679 specifies the methods of test and general requirements for quartz crystal controlled oscillators of assessed quality using either capability approval or qualification approval procedures.

2Scope / Description

This part of IEC 60679 specifies the methods of test and general requirements for quartz crystal controlled oscillators of assessed quality using either capability approval or qualification approval procedures.

3Version History

IEC 60679-1:1980 older 1980
IEC 60679-1:1980/AMD1:1985 Amd 1/1985 older 1985
IEC 60679-1:1997 1997-12
IEC 60679-1:1997/AMD1:2002 Amd 1/2002 newer 2002
IEC 60679-1:1997/AMD2:2003 Amd 2/2003 newer 2003
IEC 60679-1:2007 newer 2007-04
IEC 60679-1:2017 newer 2017-07-00

4Standard Metadata

Standard Number
IEC 60679-1:1997
Status
Replaced
Publisher
International Electrotechnical Commission (IEC)
Publication Date
1997-12
Implementation
1997-12-15
ICS Classification
01.040.31 (Electronics (Vocabularies))  31.140 (Piezoelectric and dielectric devices) 

5Citation Network

8
Cite this standard
0
Referenced herein
Standards that cite IEC 60679-1:1997
Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 3: Piezoelectric and dielectric oscillators Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification; qualification approval (IEC 60679-5:1998); German version EN 60679-5:1998 Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval (IEC 60679-4:1997); German version EN 60679-4:1998 QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY. PART 5: SECTIONAL SPECIFICATION. QUALIFICATION APPROVAL (Endorsed by AENOR in November of 1998.) Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval (IEC 60679-4:1997); German version EN 60679-4:1998

6Frequently Asked Questions

What is IEC 60679-1:1997?
IEC 60679-1:1997 — Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification is an international standard developed by International Electrotechnical Commission (IEC). This part of IEC 60679 specifies the methods of test and general requirements for quartz crystal controlled oscillators of assessed quality using either capability approval or qualification approval procedures.
What does IEC 60679-1:1997 cover?
This standard covers: This part of IEC 60679 specifies the methods of test and general requirements for quartz crystal controlled oscillators of assessed quality using either capability approval or qualification approval procedures.
Who should use this standard?
This standard is intended for organizations, professionals, and stakeholders involved in various industries and sectors. It is applicable to manufacturers, service providers, regulatory bodies, and certification organizations.
What is the latest version of IEC 60679-1:1997?
The current published version is IEC 60679-1:1997, published on 1997-12. Always check for amendments or pending revisions.
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